Material Analysis
|
| Analytical
Capabilities |
| Fieldemission-scanning-electronmicroscopy Energydispersive
X-ray-analysis SEM – EDX |
| Sparking-optical emission-spectroscopy (S)ESA |
| Inductive coupled plasma- optical emission spectoscopy ICP – OES |
| Inductive coupled plasma-mass-spectroscopy ICP – MS |
| Atomic absorption spectroscopy Graphite-furnace-Zeeman-BC / flame Fl - AAS / GF – AAS |
| Elementary analysis of O, N O-MAT / N-MAT |
| Elementary analysis of C, S C-MAT / S-MAT / TOC / DOC |
| Elementary analysis of F, Cl, Br, J Total halides / TOX / AOX |
| Fourier-transform-infrared spectroscopy FTIR / Microscope-FTIR |
| Thermoanalysis TMA, DSC, TGA, µ-TA |
| Gelpermeationchromatography GPC |
| Particle analysis |
| Scanning Force Microscopy (SFM) |
| Gaschromatography / IR / mass-spec. GC-IR-MS |
| Pyrolysis-GC-MS / TGA-GC-MS |
| Dielectric spectroscopy |
| Metallography / Microscopy |